Introducing our New 300mm Wafer Probe Station:
The “600 Series” Probe Station is designed to exceed performance metrics
of equipment priced significantly higher. Its high resolution motor driven
310mm X-Y stage is ideal for sub-micron positioning applications. The
air cooled designed platens reduce probe drift caused by high temperature
testing. Ergonomically designed.
TDR-TIME DOMAIN RETURN AND 4 POINT DIFFERENTIAL CIRCUIT
Interconnect analysis on Passive Linear devices:
PCB Populated And Unpopulated Boards, Measurements include
Reflections from discontinuities, dispersive loss, crosstalk,
EMI Radiation and susceptibility. These measurements include
TDR - Time Domain Reflectometer / TDT - Time Domain Transmission
and VNA - Vector Network Analyzer. Data then can be ported
directly to TDA system IConnect to create Spice Model reference
Probing Solutions Inc. announced today that
their newly designed line of “GP &
P” series manipulators are now available. Jack McGuffey, Engineering Director
Of Probing Solutions, Inc. explained that an excellent manipulator is the
foundation of any successful probing application and therefore superior products
Speaking of foundation, the manipulator vacuum base is so well conceived it
solidly supports the manipulator such that it literally can be used effectively on
almost any surface in the laboratory, even the walls. Axially, control is not
limited to typical X, Y & Z axis. Additional degrees of control extend to pitch,
yaw & roll on some models. Configurations are available for horizontal &
vertical board test, microwave and wafer micro-probing applications.
For more information, please contact:
Probing Solutions, Inc.
9 Enterprise Way
Dayton, NV 89403 USA
2004 by Probing Solutions, Inc.
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