Introducing our New 300mm Wafer Probe Station:

The “600 Series” Probe Station is designed to exceed performance metrics of equipment priced significantly higher. Its high resolution motor driven 310mm X-Y stage is ideal for sub-micron positioning applications. The air cooled designed platens reduce probe drift caused by high temperature testing. Ergonomically designed.

 

 

SIGNAL INTEGRITY TESTING:
TDR-TIME DOMAIN RETURN AND 4 POINT DIFFERENTIAL CIRCUIT BOARD PROBING.

2020HV Spec Sheet

Application: Interconnect analysis on Passive Linear devices: PCB Populated And Unpopulated Boards, Measurements include Reflections from discontinuities, dispersive loss, crosstalk, EMI Radiation and susceptibility. These measurements include TDR - Time Domain Reflectometer / TDT - Time Domain Transmission and VNA - Vector Network Analyzer. Data then can be ported directly to TDA system IConnect to create Spice Model reference files.  


Tel: (775)-246-0999
Fax: (775)-246-0480
Email: sales@probingsolutions.com

Probing Solutions Inc. announced today that
their newly designed line of “GP & P” series manipulators are now available. Jack McGuffey, Engineering Director Of Probing Solutions, Inc. explained that an excellent manipulator is the foundation of any successful probing application and therefore superior products are needed.

Speaking of foundation, the manipulator vacuum base is so well conceived it solidly supports the manipulator such that it literally can be used effectively on almost any surface in the laboratory, even the walls. Axially, control is not limited to typical X, Y & Z axis. Additional degrees of control extend to pitch, yaw & roll on some models. Configurations are available for horizontal & vertical board test, microwave and wafer micro-probing applications.

For more information, please contact:
Probing Solutions, Inc.
9 Enterprise Way
Dayton, NV 89403 USA
Tel: 775-246-0999
Fax: 775-246-0480
Email: sales@probingsolutions.com
Website: probingsolutions.com

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